Platforms

Electron Microscopy Platform

Ecole des Mines de Paris Centre des Matériaux BP 87
91003 EVRY cedex FRANCE
Phone: +33 1 60 76 31 73
E-mail : mohamed.sennour@mines-paristech.fr

Mohamed SENNOUR: Technical Manager

Web Site (french) >

Host:

Centre des Matériaux Pierre Marie Fourt de l’Ecole des Mines de Paris

#Technological Platform #Cell Biology – Microscopy

Electron microscopy
Imaging
Tomography
Ultramicrotomy
Ultrastructure
Cellular biology

Supervisors :

ENSMP, Mines ParisTech

Field of activity

Platform dedicated to electron microscopy in the fields of cell and tissue biology and material physics

Cell and tissue biology :

Ultrastructural morphology
Ultrastructural immunocytochemistry
Nanoparticles for protein targeting.

Material physics :

Nanomaterials and new alloys
Interfaces: structural, damage and properties
Protection of materials, multimaterials.

EQUIPMENTS

Transmission electron microscopy (FEI Tecnai F20)

Schottky field emission gun; acceleration voltage: 80–200 kV; resolution: 0.24 nm
specimen stage angle: ±30° (80° in nanotomographic mode)
Imaging in conventional and high-resolution modes with a magnification ranging from x50 to x1,000,000 (20 million on the CCD camera)
Scanning transmission electron microscopy (STEM) with bright-field detector (BF), annular dark field (ADF) and high-angle annular dark field (HAADF) modes
Local chemical analysis with an energy-dispersive X-ray spectrometer coupled to a nanometer probe
Energy-filtered imaging system (GIF) coupled to an electron energy loss spectrometer (EELS).

Scanning electron microscopy (FEI Nova NanoSEM 450)

Schottky field emission gun; beam acceleration voltage: 50 V – 30 KV; resolutions: 1 nm at 15 kV and 1.4 nm at 1 kV. High-resolution column with sufficient current for rapid EDS mappings and EBSD analyses at low and high magnification
“Low Vacuum” mode for the observation of non-conductive specimens
Secondary electron (SE) or backscatter electron (BSE) imaging studies using in-chamber or in-lens detectors with a useable magnification range from x35 to 600,000 (field width between 3.6 mm and 200 nm). Automated multi-field acquisition
Tunable-energy X-ray microanalysis with point, multi-point and mapping modes and qualitative and quantitative assessment
EBSD rapid acquisition system for crystal orientation mapping.

Samples preparation :

Ultramicrotomy: LEICA EMTRIM and LEICA ULTRACUTR
Plasma cleaner
Tint: Lynx and Microscopy Tissue Process
Sputter coater: Cressington 208HR
Carbon coater: Quorum Q150TE

ACCESS:

Contact : Julien Picot
Phone: +33 1 60 87 35 15 – email: julien.picot@genopole.fr

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